Partitioned join with dense inner table representation

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Mapping specific user credentials to temporary user favorite credentials

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Remote direct memory access socket aggregation

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Multi-device visual correlation interaction

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CAB Abstracts

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Ultrahigh vacuum scanning-tunneling microscope for in situ studies of annealing and electromigration behavior of thin films

• Authors : Smith, D [International Business Machines Corp., Yorktown Heights, NY (United States)]

• Source: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 11:1

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Gas film lubrication equations for very small clearances

• Authors : Reyna, L [International Business Machines Corp., Yorktown Heights, NY (United States). Thomas J. Watson Research Center]

• Source: Conference: 3. Argentine and Latin American tribology conference and exhibition,Buenos Aires (Argentina),8-12 Aug 1994; Other Information: PBD: [1994]

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Magnetic excitations in Kondo insulators

• Authors : Lee, Dung-Hai [International Business Machines Corp., Yorktown Heights, NY (United States). Thomas J. Watson Research Center]

• Source: Conference: Strongly correlated electronic materials,Los Alamos, NM (United States),15-18 Dec 1993; Other Information: PBD: [1993]

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A monotonicity conjecture for real cubic maps

• Authors : Tresser, C [International Business Machines Corp., Yorktown Heights, NY (United States)]

• Source: Conference: North Atlantic Treaty Organization/Advanced Study Institute (NATO/ASI) meeting on real and complex dynamical systems,Hillerod, NJ (United States),Jun 1993; Other Information: PBD: [1993]

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Magnetic instability of Kondo insulators

• Authors : Lee, Dung-Hai [International Business Machines Corp., Yorktown Heights, NY (United States). Thomas J. Watson Research Center]

• Source: Conference: International conference on strongly correlated electron systems,La Jolla, CA (United States),16-19 Aug 1993; Other Information: PBD: [1993]

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NQR investigation of pressure-induced charge transfer in oxygen-deficient YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} ({delta} = 0.38)

• Authors : Takigawa, M [International Business Machines Corp., Yorktown Heights, NY (United States). Thomas J. Watson Research Center]

• Source: Conference: Lattice effects in high {Tc} superconductors,Santa Fe, NM (United States),13-15 Jan 1992; Other Information: PBD: [1992]

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In situ XANES study of the valence state of chromium during electrochemical polarization of AlCr alloys

• Authors : Russak, M [International Business Machines Corp., Yorktown Heights, NY (United States). Thomas J. Watson Research Center]

• Source: Conference: 180. meeting of the Electrochemical Society,Phoenix, AZ (United States),13-18 Oct 1991; Other Information: PBD: [1991]

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TEM study of flux pinning defects in YBa{sub 2}Cu{sub 3}O{sub 7- {delta}} produced by 580 MeV Sn ion irradiation

• Authors : Holtzberg, F [International Business Machines Corp., Yorktown Heights, NY (United States). Thomas J. Watson Research Center]

• Source: Conference: Annual fall meeting of the Materials Research Society (MRS),Boston, MA (United States),2-6 Dec 1991; Other Information: PBD: [1991]

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Laser conditioning and electronic defect measurements of HfO sub 2 and SiO sub 2 thin films

• Authors : Stathis, J [International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center]

• Source: Conference: 22. boulder damage symposium, Boulder, CO (USA), 25-26 Oct 1990

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Adaptation of the IBM ECR (electric cantilever robot) robot to plutonium processing applications

• Authors : Crossfield, M [International Business Machines Corp., Armonk, NY (USA)]

• Source: Conference: 4. topical meeting on robotics and remote systems, Albuquerque, NM (USA), 24-28 Feb 1991

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In situ study of the effects of heavy-ion irradiation on co-evaporated CoSi sub 2 films

• Authors : Smith, D [International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center]

• Source: Conference: Fall meeting of the Materials Research Society, Boston, MA (USA), 24 Nov - 1 Dec 1990

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Computational methods for physical mapping of chromosomes

• Authors : White, S [International Business Machines Corp., Kingston, NY (USA)]

• Source: Conference: 1. international conference on electrophoresis, superconducting and the human genome, Tallahassee, FL (USA), 10-13 Apr 1990

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In situ study of effects of ion-irradiation on solid state crystallization of cobalt disilicide thin films

• Authors : Smith, D [International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center]

• Source: Conference: Symposium on new directions and future aspects of HVEM, Osaka (Japan), 8-10 Nov 1990

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Surface diffusion: Atomistics and surface morphology (Summary of MRS Symposium B panel discussion)

• Authors : Mo, Y [International Business Machines Corp., Yorktown Heights, NY (United States). Thomas J. Watson Research Center]

• Source: Conference: Materials Research Society (MRS) symposium,Boston, MA (United States),2-6 Dec 1992; Other Information: PBD: [1993]

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Scanned probe microscopy

• Authors : Wickramasinghe, H [ed.; International Business Machines Corp., Yorktown Heights, NY (United States). Thomas J. Watson Research Center]

• Source: Conference: Scanned probe microscopies: STM and beyond,Santa Barbara, CA (United States),6-11 Jan 1991; Other Information: PBD: 1992; Other Information: AIP Conference Proceedings 241

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Materials science of high temperature polymers for microelectronics

• Authors : Yoon, D [International Business Machines Corp., San Jose, CA (United States)]

• Source: Conference: Spring meeting of the Materials Research Society (MRS), Anaheim, CA (United States), 29 Apr - 3 May 1991

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Wear mechanisms of amorphous carbon and zirconia coatings on rigid disk magnetic recording media

• Authors : Rothschild, W [International Business Machines Corp., Rochester, MN (USA). Application Business Systems Div.]

• Source: Conference: Joint STLE-ASME tribology conference, Toronto (Canada), 7-10 Oct 1990

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The EISI (Elemental and Interplanar Spacing Index) index---A search/match tool for electron diffraction phase analysis

• Authors : Anderson, R [International Business Machines Corp., Hopewell Junction, NY (USA)]

• Source: Conference: 12. international congress for electron microscopy, Seattle, WA (USA), 12-18 Aug 1990

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Characterization of substrate/thin-film interfaces with x-ray microdiffraction

• Authors : Kaldor, S [International Business Machines Corp., Research Division, T. J. Watson Research Center, Yorktown Heights, New York 10598 (United States)]

• Source: Applied Physics Letters; 72; 25; Other Information: PBD: Jun 1998

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Interacting loop-current model of superconducting networks

• Authors : Bloechl, P [International Business Machines Corp., Rueschlikon (Switzerland)]

• Source: Journal of Low Temperature Physics; (United States); 88:1-2

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Factors affecting the molybdenum line slope by reactive ion etching

• Authors : Kuo, Y [International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center]

• Source: Journal of the Electrochemical Society; (USA); 137:6

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Instruction scheduling for the IBM RISC System/6000 processor

• Authors : Warren, Jr, H [International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center]

• Source: IBM Journal of Research and Development (International Business Machines); (USA); 34:1

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Managing programs and libraries in AIX Version 3 for RISC System/6000 processors

• Authors : Auslander, M [International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center]

• Source: IBM Journal of Research and Development (International Business Machines); (USA); 34:1

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The IBM RISC System/6000 processor; Hardware overview

• Authors : Montoye, R [International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center]

• Source: IBM Journal of Research and Development (International Business Machines); (USA); 34:1

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Leading-zero anticipator (LZA) in the IBM RISC System/6000 floating-point execution unit

• Authors : Montoye, R [International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center]

• Source: IBM Journal of Research and Development (International Business Machines); (USA); 34:1

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Modeling and experimental studies of oxide covered metal surfaces

• Authors : Melroy, O [International Business Machines Corp., Armonk, NY (USA)]

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Optical materials

• Authors : Ortiz, C [International Business Machines Corp., San Jose, CA (USA). Research Lab.]

• Source: Conference: Optical materials: processing and science, San Diego, CA (USA), 24-26 Apr 1989; Other Information: Materials Research Society symposium proceedings

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Growth, characterization and properties of ultrathin magnetic films and multilayers

• Authors : Marinero, E [International Business Machines Corp., San Jose, CA (USA). Research Lab.]

• Source: Conference: Growth, characterization and properties of ultrathin magnetic films and multilayers, San Diego, CA (USA), 25-28 Apr 1989; Other Information: Materials Research Society symposium

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Thin films

• Authors : Smith, D [International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center]

• Source: Conference: Thin films: stresses and mechanical properties, Boston, MA (USA), 28-30 Nov 1988; Other Information: Materials Research Society symposium proceedings. Volume 130

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Interfaces between polymers, metals, and ceramics

• Authors : Rosenberg, R [International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center]

• Source: Conference: Spring meeting of the Materials Research Society, San Diego, CA (USA), 24-28 Apr 1989

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Ion beam characterization and treatment

• Authors : Marwick, A [International Business Machines Corp., Yorktown Heights, NY (USA). Thomas J. Watson Research Center]

• Source: Metallurgical Transactions, A (Physical Metallurgy and Materials Science); (USA); 20:12

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